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Characterization of High Tc Materials and Devices by Electron Microscopy
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This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
Cambridge University Press; July 2000
407 pages; ISBN 9780511038150
Read online, or download in secure PDF format
407 pages; ISBN 9780511038150
Read online, or download in secure PDF format
Subject categories
- Academic > Physics > Electricity and magnetism > Semiconductors
- Academic > Physics > Electricity and magnetism > Superconductivity
- Academic > Physics > Electricity and magnetism > High temperature superconductors
- Academic > Physics > General > Physics; Tables
- Academic > Physics > Electricity
- Academic > Physics > Physics; Philosophy
- Science > Physics
- Science > Solid State Physics
- Technology > Material Science
ISBNs
0511038151
9780511038150
9780521554909