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X-Ray Diffraction by Polycrystalline Materials

Instrumentation and Microstructural Analysis

X-Ray Diffraction by Polycrystalline Materials
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US$ 117.00
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. Part one is a historical presentation of the discovery of X-ray diffraction. Part two is devoted to a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. A detailed analysis of the instruments used for the characterization of powdered materials or thin films is proposed in part three. The description of the processing of measured signals and their results is given. In the final part, the author presents recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. 1. Historical introduction: the discovery of X-rays and preliminary work on X-ray crystallography. 2. X-ray diffraction theory. 3. Instrumentation for X-ray diffraction. 4. Data processing, information retrieval. 5. Evaluation of results. René Guinebretière is a senior lecturer at the Ecole Nationale Supérieure de Céramiques Industrielles in Limoges, France, and teaches X-ray diffraction. His research activities are the study of materials through X-ray diffraction within the SPCTS International Laboratory in France.
ISTE; December 2006
383 pages; ISBN 9780470394533
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