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Handbook of Charged Particle Optics, Second Edition

by Jon Orloff(ed.)
Handbook of Charged Particle Optics, Second Edition by Jon Orloff
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Review of ZrO/W Schottky Cathode
L. W. Swanson and G. A. Schwind

Liquid Metal Ion Sources
R. G. Forbes and (the late) G. L. R. Mair

Gas Field Ionization Sources
R. G. Forbes

Magnetic Lenses for Electron Microscopy
K. Tsuno

Electrostatic Lenses
B. Lencová

Aberrations
P. W. Hawkes

Space Charge and Statistical Coulomb Effects
P. Kruit and G. H. Jansen

Resolution
M. Sato

Scanning Electron Microscope
A. E. Vladár and M. T. Postek

Scanning Transmission Electron Microscope
A. V. Crewe (updated by P. D. Nellist)

Focused Ion Beams
M. Utlaut

Aberration Correction in Electron Microscopy
O. L. Krivanek, N. Dellby and M. F. Murffitt

Appendix: Computational Resources for Electron Microscopy
J. Orloff (with valuable information from P. W. Hawkes and B. Lencová)

Index

CRC Press; October 2008
688 pages; ISBN 9781420045550
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Title: Handbook of Charged Particle Optics, Second Edition
Author: Jon Orloff
 
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