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Handbook of Charged Particle Optics
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Balancing its coverage of theory with a wide range of application areas, "Handbook of Charged Particle Optics" provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.
Taylor & Francis; October 2008
688 pages; ISBN 9781420045550
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688 pages; ISBN 9781420045550
Read online, or download in secure PDF format