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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin
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Identifies problems that all specimens present in examining their structure and analysis in the SEM

Describes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identified

Guides the reader through a general approach to the problem before a particular procedure is applied to the requirements of a given sample

Designed both as an introduction for the novice and as a guide for the practicing scanning microscopist

Springer US; April 2011
328 pages; ISBN 9780387857312
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Title: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Author: Patrick Echlin
 
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