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Two-dimensional X-Ray Diffraction

Two-dimensional X-Ray Diffraction by B. B. He
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The fundamentals, theory, and wide-ranging applications of two-dimensional X-ray diffraction

Two-Dimensional X-Ray Diffraction is proving itself as an ideal non-destructive, analytical method for measuring the atomic arrangement of materials and extracting an array of information beyond the limitations of conventional X-ray diffraction. Researchers in materials science, chemistry, physics, pharmaceuticals, and related fields will find this introductory reference invaluable in understanding and applying two-dimensional X-ray diffraction for examining a broad range of samples.

Two-Dimensional X-Ray Diffraction shows how two-dimensional X-ray diffraction can be a useful tool for the examination of metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials and composites for material science researches, molecular structure determination and polymorphism study for drug discovery and processing, and samples with micro volume or micro-area for forensic analysis, and archaeology analysis, to name just a few of the method's applications.

The text covers:

  • The fundamentals of X-ray diffraction and its extension to two-dimensional X-ray diffraction

  • The geometry conventions and diffraction vector approach for diffraction data interpretation, data correction, and process algorithms for various applications

  • Instrumentation technologies, including the critical components, such as X-ray source and optics, two-dimensional detectors, goniometer, and sample stages

  • The configurations of the two-dimensional X-ray diffraction systems for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening

  • Experimental examples in materials research, pharmaceuticals, materials processing, and quality control

Written by one of the pioneers in the field, Two-Dimensional X-Ray Diffraction brings readers up to speed on a fast-rising, state-of-the-art method for materials characterization.

Wiley; October 2009
426 pages; ISBN 9781118210758
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Title: Two-dimensional X-Ray Diffraction
Author: B. B. He
 
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