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Nanoscale Characterization of Surfaces and Interfaces
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Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale
Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information less
Subject categories
- Academic > Physics > Atomic physics > Solids
- Academic > Physics > Atomic physics > Surfaces (Physics)
- Academic > Physics > Physics; Abstracts; Periodicals
- Academic > Physics > Physics; Early works to 1800
- Science > Thermodynamics
- Science > Physics
- Technology > Engineering
- Technology > Material Science
ISBNs
3527615946
9783527292479
9783527615940