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Trap Level Spectroscopy in Amorphous Semiconductors

Trap Level Spectroscopy in Amorphous Semiconductors
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US$ 149.95
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Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

  • Provides information on the most used spectroscopic techniques
  • Discusses the advantages and disadvantages of each technique
Elsevier Science; June 2010
128 pages; ISBN 9780123847164
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