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Testing Complex and Embedded Systems

Testing Complex and Embedded Systems by Kim H. Pries
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Does Your Testing Look Like This?
Last-Minute Flailing
Fiascos Uncovered Weeks before Launch
Huge Warranty Problems
Customer Dissatisfaction

Benefits of Improved Testing
Product Problems Revealed Early
Improved Reliability = Lower Cost
Happy Customers
Confidence in a Fine Product
Cost-Effective Testing Solutions Not Waiting Until
the Last Minute
Overview
Goals of Testing
Types of Testing
Levels of Testing

Basic Principles
Looking at the Evidence

The Question
Not Phrases
Instead

Contradictory Perspectives of Testing
Organic/Inorganic
Quantitative/Qualitative
Objective/Subjective
Deterministic/Probabilistic
Variable/Attribute
Continuous/Discrete
Wide-Ranging/Focused
Many/Few
Structure/Unstructured
Ordered/Random
Nominal/Overstress
Single Environment/Multiple Environments
Compliance/Characterization
High-Level/Detailed
Growing/Imposing
Bench/Field
Abstraction/Verisimilitude
Reproducible/Nonreproducible
Repeatable/Nonrepeatable
Linear/Nonlinear
Fine/Coarse
Combinatorial/Exhaustive/Stochastic
Focused/Fuzzy
Instant/Enduring
Inside System/Outside System
Ambiguity/Clarity
Sensitive/Insensitive
Long-Range/Short-Range
Costly/Cheap
Flexible/Inflexible
Parameter/Tolerance
Standard/Failure
"Good"/"Bad" Testing
Parallel/Sequential
Fractal/Smooth/Ordered

The Use of Noise
Realistic
Can Use Taguchi Approach
Sometimes Difficult to Simulate
Where to Apply Noise?
Exogenous Shocks
Self-Generated Noise

How to Perform "Bad’’ Tests
Do Not
Do
Documenting the Testing
Components of a Test Plan
Components of a Test Report
The DVP&R Format
Failures

Test Administration
Test Management
Test Scheduling
Test Human Resources
Test Device Resources
Test Quality
Test Costing
Test Risk
Calibration Issues

Advanced Concepts
Test Impacts
Construct Validity
Types of Bias
Reliability and Confidence
Life Testing
Testing Team Early Involvement

Software Test Documentation
IEEE
Defect Life Cycle

Configuration Management
Configuration Management Areas
Planning
Elements of Configuration Management
Importance of Configuration Management
Links to Testing
Risks

Software Testing
Overview
Software Testing—The Problem
Test Metrics
Software Boundary Testing
Static Code Analysis
Dynamic Code Analysis

Systems Testing
End-to-End Testing
Big-Bang Testing
Top-Down Testing
Bottom-Up Testing
Managing Multiple Test Hardware
and Software Deliveries
Test Configuration Management
System Variations and Test Demands
Functional Testing
System Response to Multiple System Failures
Ranges of System Performance

Simulation and Emulation
Simulation
Simulation Levels
Simulation Activities
Objectives of Simulation
Simulation as Verification
Simulation as Test Preparation
Conflict between Simulation and Test Results

Span of Tests
Software
Unit Test
Component Test
Subsystem-Level Integration Testing
System
Production Test
Static Analysis
Structural Analysis
Simulation
Prototyping and Simulation
Reliability and Confidence
Limitations of Reliability and Confidence
Concept of "Life" and the Product
Establishing Product Life Exposure

Exit Criteria
When Is Enough, Enough?
Compared to Plan?
Testing Ethics
Final Words

Bibliography
Index

CRC Press; December 2010
316 pages; ISBN 9781439821411
Read online, or download in secure PDF format
Title: Testing Complex and Embedded Systems
Author: Kim H. Pries; Jon M. Quigley
 
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