Aberration-corrected Analytical Electron Microscopy
Edited and written by the founders of the world’s first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text:
- Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes
- Is based on an established course taught at postgraduate summer schools by leaders in this field.
- Is essential reading for researchers involved in the analysis of materials at the nanoscale
Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.
296 pages; ISBN 9781119979906
, or download in or
Title: Aberration-corrected Analytical Electron Microscopy
Author: Rik Brydson