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Surface and Thin Film Analysis

A Compendium of Principles, Instrumentation, and Applications

Surface and Thin Film Analysis
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US$ 205.00
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Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
Wiley; March 2011
558 pages; ISBN 9783527636938
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