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Test and Diagnosis for Small-Delay Defects

Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor
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Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects

Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies

Shows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flow

Springer New York; September 2011
227 pages; ISBN 9781441982971
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Title: Test and Diagnosis for Small-Delay Defects
Author: Mohammad Tehranipoor; Ke Peng; Krishnendu Chakrabarty
 
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