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  • Thin Film Analysis by X-Ray Scatteringby Mario Birkholz

    Wiley 2006; US$ 210.00

    With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists,... more...

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