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  • Optical Inspection of Microsystemsby Wolfgang Osten

    CRC Press 2006; US$ 194.95

    Image Processing and Computer Vision for MEMS Testing ; Markus Hüttel Introduction Classification of Tasks Image Processing and Computer Vision Components Processing and Analysis of Image Data Commercial and Noncommercial Image Processing and Computer Vision Software Image Processing Techniques for the Processing of Fringe Patterns in... more...

  • Fringe 2005by Wolfgang Osten

    Springer-Verlag Berlin and Heidelberg GmbH & Co. KG 2006; US$ 239.00

    Presents to engineers, scientists and industrial experts the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moire and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. more...

  • Fringe 2013by Wolfgang Osten

    Springer 2013; US$ 399.00

    In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for... more...

  • Fringe 2009by Wolfgang Osten; Malgorzata Kujawinska

    Springer 2010; US$ 459.00

    The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state of the art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields. Topics of particular interest are: new Methods and Tools for the Generation, Acquisition,... more...

  • Optical Imaging and Metrologyby Wolfgang Osten; Nadya Reingand

    Wiley 2012; US$ 150.00

    A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology ? an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by leading experts, it fills a gap in the current literature by bridging the... more...

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