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Semiconductors; Optical properties; Congresses

  • Characterization in Silicon Processingby Yale Strausser

    Elsevier Science 2013; US$ 72.95

    This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to discuss typical problems seen throughout that films' history,... more...

  • Porous Silicon in Practiceby M. J. Sailor

    Wiley 2012; US$ 129.00

    Michael J. Sailor has been working in the porous silicon field for 20 years. He received a B.S. degree in Chemistry from Harvey Mudd College (Claremont, CA) and a PhD in Chemistry from Northwestern University (Chicago). He holds the position of Professor in the Department of Chemistry and Biochemistry at the University of California, San Diego (UCSD).... more...

  • Characterization in Silicon Processingby Yale E. Strausser

    Momentum Press 2010; US$ 98.00

    With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer manufacture where materials properties, processing and associated problems are brought to the fore. The book is organized by the types of materials commonly... more...

  • Shape and Functional Elements of the Bulk Silicon Microtechniqueby Joachim Frühauf

    Springer 2005; US$ 189.00

    This methodic manual presents a survey of the form-related and functional elements of the bulk silicon microtechnique. It gives a systematic description of simple shape elements and of elements for mechanical, fluidic and optical applications. This manual includes practical instructions for the use of the relevant techniques and an extensive collection... more...

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