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Semiconductors; Optical properties; Congresses

  • Characterization in Silicon Processingby Yale Strausser

    Elsevier Science 2013; US$ 72.95

    This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to discuss typical problems seen throughout that films' history,... more...

  • Porous Silicon in Practiceby M. J. Sailor

    Wiley 2012; US$ 129.00

    By means of electrochemical treatment, crystalline silicon can be permeated with tiny, nanostructured pores that entirely change the characteristics and properties of the material. One prominent example of this can be seen in the interaction of porous silicon with living cells, which can be totally unwilling to settle on smooth silicon surfaces but... more...

  • Characterization in Silicon Processingby Yale E. Strausser

    Momentum Press 2010; US$ 98.00

    With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer manufacture where materials properties, processing and associated problems are brought to the fore. The book is organized by the types of materials commonly... more...

  • Shape and Functional Elements of the Bulk Silicon Microtechniqueby Joachim Frühauf

    Springer Berlin Heidelberg 2005; US$ 189.00

    The idea for this manual was created by the author and Birgit Hannemann (now Professor at the University of Applied Sciences, Bremen, Germany) as an internal catalogue of results of several years of investigations at the Chemnitz University of Technology, Germany. At this base supplying investigations and the elabo- tion of the manuscript were supported... more...

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