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  • Handbook of Deposition Technologies for Films and Coatingsby Rointan F. Bunshah; Rointan F. Bunshah

    Elsevier Science 1994; US$ 219.00

    This second edition, edited by the world-renowned Dr. Rointain Bunshah, is an extensive update of the many improvements in deposition technologies, mechanisms, and applications. Considerably more material was added in Plasma Assisted Vapor Deposition processes, as well as Metallurgical Coating Applications. more...

  • Handbook of Ellipsometryby Harland Tompkins; Eugene A Irene; Harland Tompkins; Eugene A Irene

    Elsevier Science 2005; US$ 325.00

    The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological... more...

  • Polarized Light and Optical Measurementby D. N. Clarke; J.F. Grainger; D. Ter Haar

    Elsevier Science 2013; US$ 31.95

    Polarized Light and Optical Measurement is a five-chapter book that begins with a self-consistent conceptual picture of the phenomenon of polarization. Chapter 2 describes a number of interactions of light and matter used in devising optical elements in polarization studies. Specific optical elements are given in Chapter 3. The last two chapters explore... more...

  • Spectroscopic Ellipsometryby Hiroyuki Fujiwara

    Wiley 2007; US$ 232.00

    Dr Hiroyuki Fujiwara is based at the National Institute of Advanced Industrial Science and Technology, Ibaraki, Japan. He received his PhD at the Tokyo Institute of Technology in 1996 and carried out post-doctoral research with Professor R.W. Collins at Penn State University. From 1998 to present he has been working as a senior research scientist... more...

  • A User's Guide to Ellipsometryby Harland G. Tompkins

    Elsevier Science 2012; US$ 72.95

    This book is specifically designed for the user who wishes expanded use of ellipsometry beyond the relatively limited number of turn-key applications. The book provides a concise discussion of theory and instrumentation before describing how to use optical parameters to determine material properties and optical parameters for inaccessible substrates... more...

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