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- ISTE 2006; US$ 117.00
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. Part one is a historical presentation of the discovery of X-ray diffraction. Part two is devoted to a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. A detailed analysis of the instruments... more...
- Oxford University Press, UK 2004; US$ 64.99
Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.... more...
- Momentum Press 2013; US$ 189.00
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity... more...
- Elsevier Science 2013; US$ 72.95
Advances in Structure Research by Diffraction Methods reviews advances in the use of diffraction methods in structure research. Topics covered include the dynamical theory of X-ray diffraction, with emphasis on Ewald waves in theory and experiment; dynamical theory of electron diffraction; small angle scattering; and molecular packing. This book... more...
- Elsevier Science 2013; US$ 72.95
Advances in X-Ray Spectroscopy covers topics relevant to the advancement of X-ray spectroscopy technology. The book is a collection of papers written by specialists in X-ray spectroscopy and pays tribute to the scientific work of Prof. Yvette Cauchois. The text is organized into four parts. Part I covers the analysis of X-ray transitions between atomic... more...
- Wiley 2013; US$ 140.00
Julian Stangl is working on the investigation of semiconductor nanostructures using x-ray scattering at Johannes Kepler University in Linz, Austria, where he also obtained his academic degrees. He has performed numerous experiments at synchrotron sources throughout Europe, and is developing nanobeam diffraction in collaboration with the European Synchrotron... more...
- Wiley 2014; US$ 86.50
Stefan Hau-Riege is the X-ray Science and Technology Group Leader at the Lawrence Livermore National Laboratory (LLNL), where he works on x-ray free-electron-laser interactions with materials, x-ray instrumentation, and ultrafast imaging, drawing on computational and experimental physics. Previously, he worked on extreme-ultraviolet lithography and... more...
- World Scientific Publishing Company 2003; US$ 194.00
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very... more...
- Oxford University Press, UK 2007; US$ 198.99
The book offers the first comprehensive review of experimental methods, theory, and successful applications of synchrotron radiation based inelastic X-ray scattering (IXS) spectroscopy, which enables the investigation of electron dynamics in condensed matter (correlated motion and excitation). - ;Knowledge of the dynamics of many-electron systems is... more...
- Cambridge University Press 1999; US$ 60.00
This self-contained, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The book will be of great interest to graduate students, researchers... more...