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- Springer 2010; US$ 279.00
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications,... more...
- Oxford University Press 2004; US$ 249.99
The mathematician John Pell was a member of that golden generation of scientists Boyle, Wren, Hooke, and others which came together in the early Royal Society. Although he left a huge body of manuscript materials, he has remained an extraordinarily neglected figure, whose papers have never been properly explored. This book, the first ever full-length... more...
- Elsevier Science 2011; US$ 190.00
Work with individual atoms and molecules aims to demonstrate that miniaturized electronic, optical, magnetic, and mechanical devices can operate ultimately even at the level of a single atom or molecule. As such, atomic and molecular manipulation has played an emblematic role in the development of the field of nanoscience. New methods based on the... more...
- Springer 2011; US$ 29.95
Il libro prende le mosse dai pensieri di un giovane che alla maturit liceale si trova affascinato dalla cultura dei classici greco-latini, dai rudimenti filosofici e dall impatto con le scienze fisiche e naturali. Il latino e i suoi naturalisti hanno suscitato un fervore verso la Botanica Sistematica che lo riporta a Linneo e quindi alla conoscenza... more...
- Elsevier Science 2012; US$ 72.95
Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact... more...
- World Scientific Publishing Company 1996; US$ 120.00
This book discusses the various principles in confocal scanning microscopy which has become a useful tool in many practical fields including biological studies and industrial inspection. The methodology presented in this book is unique and is based on the concept of the three-dimensional transfer functions which have been developed by the author and... more...
- World Scientific Publishing Company 1999; US$ 99.00
Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists AFM offers the prospect of high resolution images of... more...
- World Scientific Publishing Company 2009; US$ 114.00
The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. It is also poised to contribute much new spatially-resolved and time-resolved insights of... more...
- Springer 2014; US$ 269.00
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological... more...
- Elsevier Science 2013; US$ 72.95
Introduction to Electron Microscopy, Second Edition provides an introduction to the foundations of electron microscopy; an outline of some practical aspects of instrument operation; and discussion of the rationale of the methodology of biological specimen preparation. The book seeks to provide a comprehensive understanding of the theoretical and operational... more...