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Efficient Test Methodologies for High-Speed Serial Links

Efficient Test Methodologies for High-Speed Serial Links by Dongwoo Hong
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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Springer Netherlands; December 2009
103 pages; ISBN 9789048134434
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Title: Efficient Test Methodologies for High-Speed Serial Links
Author: Dongwoo Hong; Kwang-Ting Cheng
 
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